Analogue Electronics

Unit code:NEE2205Study level:Undergraduate

Credit points

12
(Generally, 1 credit = 10 hours of classes and independent study.)

Location

Footscray Park

Prerequisites

NEF1205 - Engineering Fundamentals
(Or equivalent to be determined by unit coordinator)
Co-requisites
(Corequisite units must be studied concurrently with this unit)

Overview

This unit introduces operational amplifiers as fundamental building blocks of analogue electronic systems. Students will explore the ideal op-amp model and analyse key circuit configurations such as single-ended and differential amplifiers, integrators, differentiators, summing amplifiers, and instrumentation amplifiers. The unit then extends to examine non-ideal op-amp characteristics, including saturation, input offset voltage, bias currents, finite open-loop gain, and limited gain–bandwidth product, highlighting their impact on practical circuit performance.



In the latter part of the unit, students are introduced to semiconductor discrete devices at an introductory level, including zener diodes, bipolar junction transistors (BJTs), and metal-oxide-semiconductor field-effect transistors (MOSFETs). Practical design considerations such as biasing, stability, and amplifier configuration are addressed using selected device examples, enabling students to connect theoretical concepts with hands-on circuit implementation and testing.

Learning Outcomes

On successful completion of this unit, students will be able to:

  1. Apply the ideal operational amplifier model to analyse and predict the behaviour of fundamental op-amp circuits;
  2. Evaluate non-ideal op-amp properties and implement appropriate compensation methods to optimise performance;
  3. Explain the operating principles and key characteristics of semiconductor devices, including diodes, BJTs, and MOSFETs;
  4. Design, construct, and test both independently and collaboratively single-stage amplifier circuits using discrete semiconductor components; and
  5. Compare and contrast operational amplifiers and discrete semiconductor devices in terms of linearity, gain, and practical applications.

Assessment

For Melbourne campuses

Assessment type: Test | Grade: 25%

In-class invigilated problem solving test (Individual) (50 minutes)

Assessment type: Test | Grade: 25%

In-class invigilated problem solving test (Individual) (50 minutes)

Assessment type: Practicum | Grade: 50%

Laboratory practicum and Reports (Group) (3000 words)

Tests: These secure invigilated in class assessments have a problem-solving scenario format that tests understanding, requires explanation of reasoning and process, and involves applying knowledge to new contexts.

Practicum: This secure assessment ensures accountability by requiring students to undertake lab tasks under supervision. Real-time observation and process-focused questioning verify understanding and application of analytical skills. Progressive milestone checks, documented collaboration and individual contributions ensure accountability and support verification of each student’s engagement. Explicit evaluation of individual contributions further supports the secure assessment and assurance of each student’s achievement of learning outcomes.

Required reading

Microelectronic Circuits.
Sedra, A. & Smith, K., (2014). | Oxford University Press.

As part of a course

This unit is studied as part of the following course(s):

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